Cu gettering by phosphorus-doped emitters in p-type silicon: Effect on light-induced degradation
Sign Up to like & getrecommendations! Published in 2018 at "AIP Advances"
DOI: 10.1063/1.5012680
Abstract: The presence of copper (Cu) contamination is known to cause relevant light-induced degradation (Cu-LID) effects in p-type silicon. Due to its high diffusivity, Cu is generally regarded as a relatively benign impurity, which can be… read more here.
Keywords: phosphorus doped; light induced; phosphorus; induced degradation ... See more keywords