Assessing the Impact of Thermal Profiles on the Elimination of Light- and Elevated-Temperature-Induced Degradation
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DOI: 10.1109/jphotov.2018.2874769
Abstract: Light- and elevated-temperature-induced degradation (LeTID) in p-type multicrystalline silicon has a severe impact on the effective minority carrier lifetime of silicon and remains a crucial challenge for solar cell manufacturers. The precise cause of the… read more here.
Keywords: elevated temperature; impact; temperature; light elevated ... See more keywords
Hydrogenation and Gettering Compatible p-Type Contacts for Multicrystalline Silicon Cells, Free of Light, and Elevated Temperature Induced Degradation
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DOI: 10.1109/jphotov.2020.2999869
Abstract: Results for a room temperature contacting method applied to the p-type rear surface of monocrystalline and multicrystalline solar cell structures are presented. Monocrystalline silicon devices with the rear contacts prepared using the point contacting by… read more here.
Keywords: multicrystalline silicon; silicon cells; elevated temperature; temperature ... See more keywords
Temporary Recovery of the Defect Responsible for Light- and Elevated Temperature-Induced Degradation: Insights Into the Physical Mechanisms Behind LeTID
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Journal of Photovoltaics"
DOI: 10.1109/jphotov.2020.3025240
Abstract: The effect of light- and elevated temperature-induced degradation (LeTID) can be nonpermanently reversed by charge carrier injection below the degradation temperature (commonly used degradation temperatures are above ∼70 °C). In this study, we show that the… read more here.
Keywords: elevated temperature; temperature; light elevated; degradation ... See more keywords