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Published in 2024 at "IEEE Sensors Journal"
DOI: 10.1109/jsen.2024.3449139
Abstract: In the era of intelligent manufacturing, faced with the explosive growth of equipment and sensor data, deep learning (DL)-based fault diagnosis methods with significant feature extraction capabilities have been widely applied. However, as DL networks…
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Keywords:
edge;
edge computing;
computing architecture;
lightweight edge ... See more keywords