Overcoming Practical Limitations to Probe Electronic Structure in Novel Quantum Materials
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DOI: 10.1017/s1431927620015640
Abstract: Scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) can provide detailed structural and chemical characterization across a wide range of materials and length scales. Especially when atomic lattice-scale variations can enhance or… read more here.
Keywords: microscopy; limitations probe; practical limitations; electronic structure ... See more keywords