Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)
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DOI: 10.1002/adma.201970340
Abstract: Author(s): Zhao, Peida; Wang, Ruixuan; Lien, Der‐Hsien; Zhao, Yingbo; Kim, Hyungjin; Cho, Joy; Ahn, Geun Ho; Javey, Ali read more here.
Keywords: scanning probe; monolayer; semiconductors scanning; lithography patterning ... See more keywords