Modeling local item dependence in C-tests with the loglinear Rasch model
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DOI: 10.1177/02655322231155109
Abstract: C-tests are gap-filling tests mainly used as rough and economical measures of second-language proficiency for placement and research purposes. A C-test usually consists of several short independent passages where the second half of every other… read more here.
Keywords: item dependence; rasch model; local item; model ... See more keywords