Efficient defect identification of soft failures induced by device local mismatch for nano-scale SRAM yield improvement
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DOI: 10.1016/j.mssp.2016.12.006
Abstract: Abstract As the device size continues shrinking to nano-scale region, tiny defects induced device local mismatch in SRAM array becomes a major yield limiter. It is often quite time consuming and challenging to identify such… read more here.
Keywords: methodology; local mismatch; induced device; device local ... See more keywords