Quantifying local thickness and composition in thin films of organic photovoltaic blends by Raman scattering
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DOI: 10.1039/c7tc01472d
Abstract: We report a methodology based on Raman spectroscopy that enables the non-invasive and fast quantitative determination of local thickness and composition in thin films (from a few monolayers to hundreds of nm) of one or… read more here.
Keywords: methodology; thin films; local thickness; thickness composition ... See more keywords