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Published in 2017 at "Journal of Electronic Materials"
DOI: 10.1007/s11664-017-5691-6
Abstract: We present an x-ray micro-diffraction investigation of localized strain and lattice disorientation in HgCdTe layers with a submicronic resolution using a synchrotron white beam in Laue configuration. Diffraction peak displacement mapping evidences bending of the…
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Keywords:
diffraction investigation;
localized strain;
mesa etched;
diffraction ... See more keywords
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Published in 2019 at "Solid-State Electronics"
DOI: 10.1016/j.sse.2019.03.051
Abstract: Abstract This paper investigates the digital circuit-level performance of an inverter realised with n- and p-type tunnel field-effect transistors (TFETs) integrated on the same InAs/ Al 0.05 Ga 0.95 Sb tech nology platform in the…
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Keywords:
presence;
transient;
performance;
traps localized ... See more keywords