A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction
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DOI: 10.1109/tcsii.2020.3004371
Abstract: A scan architecture is the most widely used for obtaining high test coverage in manufacturing tests. However, the recent increase in circuit size has caused the power consumption during scan testing to become higher than… read more here.
Keywords: based scan; test; topology based; topology ... See more keywords