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Published in 2021 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2020.3011765
Abstract: This article presents a new method for the calculation of the dielectric constant of low-loss materials having a thickness of more than half a wavelength in the sample. The proposed method relies solely on the…
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Keywords:
loss materials;
low loss;
calculation;
loss ... See more keywords
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Published in 2022 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2022.3156986
Abstract: A waveguide-based measurement configuration is proposed, as a modification to the traditional completely filled waveguide technique, for microwave characterization of relatively thin and high-loss materials. This method is aimed to overcome the large measurement errors…
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Keywords:
high loss;
loss materials;
loss;
microwave characterization ... See more keywords