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Published in 2020 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2020.125703
Abstract: Abstract We report on the crystalline quality of low-temperature-grown (LTG) InxGa1−xAs coherently grown on InP(0 0 1) substrate using molecular beam epitaxy at a substrate temperature of 250 °C. The InxGa1−xAs was characterized using high-resolution X-ray diffraction (XRD)…
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Keywords:
ltg in0;
crystalline quality;
inp substrate;
54ga0 46as ... See more keywords