Interferometric mapping of material properties using thermal perturbation
Sign Up to like & getrecommendations! Published in 2018 at "Proceedings of the National Academy of Sciences of the United States of America"
DOI: 10.1073/pnas.1712763115
Abstract: Significance Rapid, accurate, and nondestructive mapping of material properties is of great interest in many fields, with applications ranging from detection of defects or other subsurface features in semiconductors to estimating temperature rise in various… read more here.
Keywords: phase; temperature; mapping material; phase changes ... See more keywords