Broadband Mueller ellipsometer as an all-in-one tool for spectral and temporal analysis of mutarotation kinetics
Sign Up to like & getrecommendations! Published in 2023 at "RSC Advances"
DOI: 10.1039/d3ra00101f
Abstract: Spectroscopic Mueller matrix ellipsometry is becoming increasingly routine across physical branches of science, even outside optics. The highly sensitive tracking of the polarization-related physical properties offers a reliable and non-destructive analysis of virtually any sample… read more here.
Keywords: matrix ellipsometry; mutarotation; mueller; spectroscopy ... See more keywords
Nondestructive measurement of the thickness and refractive index of polymer thin films using a single-frequency terahertz Mueller matrix ellipsometry.
Sign Up to like & getrecommendations! Published in 2025 at "Optics express"
DOI: 10.1364/oe.560679
Abstract: Terahertz Mueller matrix ellipsometry is a nondestructive technique based on terahertz waves that can measure film thickness and optical constants with high accuracy. We propose a single-frequency terahertz Mueller matrix ellipsometry based on a dual… read more here.
Keywords: matrix ellipsometry; mueller matrix; terahertz mueller; terahertz ... See more keywords