Endurance of 2 Mbit Based BEOL Integrated ReRAM
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Access"
DOI: 10.1109/access.2022.3223657
Abstract: In this work, we experimentally characterize the endurance of 2 Mbit resistive switching random access memories (ReRAMs) from a 16 MBit test-chip. Here, very rare failure events where the memory cells become stuck in the… read more here.
Keywords: endurance; mbit based; reram; based beol ... See more keywords