Calibration of high magnification in the measurement of critical dimension by AFM and SEM
Sign Up to like & getrecommendations! Published in 2021 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2021.150481
Abstract: Abstract In the measurement of critical dimension (CD) by scanning electron microscopy (SEM) and atomic force microscopy (AFM), the measured linewidths of the CD patterns are different from the real values due to the edge… read more here.
Keywords: afm sem; microscopy; magnification; measurement critical ... See more keywords
Measurement of Critical Properties for Binary and Ternary Mixtures Containing n-Butanol and n-Alkane
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Chemical & Engineering Data"
DOI: 10.1021/acs.jced.8b00585
Abstract: The critical temperatures (Tc) and critical pressures (pc) of five binary mixtures of n-butanol + n-alkane (C = 6, 7, 8, 9, 10) as well as two ternary mixtures (n-butanol + hexane + heptane and… read more here.
Keywords: butanol alkane; binary mixtures; ternary mixtures; butanol ... See more keywords