Direct Measurement of Negative Capacitance in Ferroelectric/Semiconductor Heterostructures.
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DOI: 10.1021/acsami.2c19930
Abstract: Negative capacitance (NC) is now an attractive research topic owing to its potential applications. For better integration, investigation about the phenomenon and mechanism of NC in ferroelectric materials on semiconductor substrates is important. In this… read more here.
Keywords: negative capacitance; semiconductor; ferroelectric semiconductor; direct measurement ... See more keywords