Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories
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DOI: 10.1109/jeds.2019.2943133
Abstract: Emerging non-volatile memories are becoming increasingly attractive for embedded and storage-class applications. Among the development challenges of Back-End integrated memory cells are long learning cycles and high wafer cost. We propose a short-flow based approach… read more here.
Keywords: short flow; test; measurement requirements; requirements short ... See more keywords