Sign Up to like & get
recommendations!
0
Published in 2018 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2017.10.005
Abstract: In a transmission electron microscope, electron illumination beam tilt, or the degree of deviation of electron beam from its optical axis, is an important parameter that has a significant impact on image contrast and image…
read more here.
Keywords:
microscopy;
small residual;
measuring small;
beam tilts ... See more keywords
Sign Up to like & get
recommendations!
0
Published in 2018 at "Materials"
DOI: 10.3390/ma11050751
Abstract: Measuring small-magnitude strain fields using a digital image correlation (DIC) technique is challenging, due to the noise-signal ratio in strain maps. Here, we determined the level of accuracy achievable in measuring small-magnitude (
read more here.
Keywords:
image;
measuring small;
strain fields;
small magnitude ... See more keywords