Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle
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DOI: 10.1109/access.2020.3031022
Abstract: The physics-of-failure (PoF) technique is a practical approach to evaluate the reliability of semiconductor devices. However, the PoF approaches are usually insufficient in dealing with multi-mechanism failure and fitting the Monte Carlo (MC) sampling data.… read more here.
Keywords: physics; failure; multi mechanism; mechanism failure ... See more keywords