Lightweight Integrated Design of PUF and TRNG Security Primitives Based on eFlash Memory in 55-nm CMOS
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2020.2976632
Abstract: We present a lightweight, suitable for Internet of Things (IoT) devices, integrated design of physically unclonable function (PUF) and true random number generator (TRNG) based on embedded flash memory in 55-nm CMOS. In the proposed… read more here.
Keywords: integrated design; puf trng; memory cmos;