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Published in 2017 at "Journal of Electronic Materials"
DOI: 10.1007/s11664-017-5691-6
Abstract: We present an x-ray micro-diffraction investigation of localized strain and lattice disorientation in HgCdTe layers with a submicronic resolution using a synchrotron white beam in Laue configuration. Diffraction peak displacement mapping evidences bending of the…
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Keywords:
diffraction investigation;
localized strain;
mesa etched;
diffraction ... See more keywords