A Lightweight Microscopic Metal Fracture Classification Method With Structure Pruning and Knowledge Distillation for Embedded Devices
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DOI: 10.1109/tim.2024.3509596
Abstract: Microscopic metal fracture (MF) recognition is essential for modern intelligent fault diagnosis. Existing deep learning (DL) methods have achieved high recognition performance but are hard to apply on industrial resource-limited devices due to being overparameterized.… read more here.
Keywords: classification; microscopic; microscopic metal; metal fracture ... See more keywords