LAUSR

Methodological development of topographic correction in 2D/3D ToF-SIMS images using AFM images

Sign Up to like & get
recommendations!
0 Published in 2018 at "Applied Surface Science"

DOI: 10.1016/j.apsusc.2017.05.217

Abstract: Abstract Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an emerging technique that provides chemical information directly from the surface of electronic materials, e.g. OLED and solar cell. It is very versatile and highly sensitive mass spectrometric… read more here.

Keywords: methodological development; information; image; tof sims ... See more keywords