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Published in 2019 at "Optics and Lasers in Engineering"
DOI: 10.1016/j.optlaseng.2019.03.005
Abstract: Abstract This paper presents a novel reference artifact and procedure for assessing the metrological performance of structured-light 3D scanners, also known as fringe projection systems. Despite the increasing popularity of these scanners, there is still…
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Keywords:
artifact;
metrological performance;
light scanners;
structured light ... See more keywords
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Published in 2019 at "Measurement Science and Technology"
DOI: 10.1088/1361-6501/ab1d27
Abstract: Non-raster scanning has been proved to be an effective approach to dramatically improve the efficiency of the scanning probe microscopy without sophisticated scanners and controllers. However, the metrological performance of the method largely depends on…
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Keywords:
regression;
microscopy;
non raster;
raster scanning ... See more keywords