Achieving metrological precision limits through post-selection
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DOI: 10.1103/physreva.95.012104
Abstract: Post-selection strategies have been proposed with the aim of amplifying weak signals, which may help to overcome detection thresholds associated with technical noise in high-precision measurements. Here we use an optical setup to experimentally explore… read more here.
Keywords: metrological precision; post selection; post; achieving metrological ... See more keywords