A Novel Microdefect Imaging System for High-Reflective Material Surfaces
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DOI: 10.1109/tim.2025.3541809
Abstract: Highly reflective materials, owing to their reflective characteristics, pose challenges in imaging microdefects under conventional lighting, resulting in a substantial number of missed detections. This article presents an imaging method tailored for microdefects on the… read more here.
Keywords: microdefect imaging; novel microdefect; imaging system; high reflective ... See more keywords