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Published in 2017 at "Measurement Science and Technology"
DOI: 10.1088/1361-6501/28/1/015904
Abstract: An analytical electron microscope based on the scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy (STEM-WDX) to realize highly sensitive elemental imaging especially for light elements has been developed. In this study, a large-solid-angle…
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Keywords:
based scanning;
analytical electron;
electron microscope;
spectroscopy ... See more keywords
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Published in 2025 at "Measurement Science and Technology"
DOI: 10.1088/1361-6501/ade329
Abstract: Accurate characterization of thin film optical properties is important for the electronics and photonics industries. This paper focuses on optimizing measurement accuracy for microscope-based reflectometers with an on-axis incident beam. Key factors analyzed include the…
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Keywords:
optimizing measurement;
microscope;
film optical;
thin film ... See more keywords
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Published in 2017 at "Journal of Microscopy"
DOI: 10.1111/jmi.12494
Abstract: We report on a very compact desk‐top transmission extreme ultraviolet (EUV) microscope based on a laser‐plasma source with a double stream gas‐puff target, capable of acquiring magnified images of objects with a spatial (half‐pitch) resolution…
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Keywords:
microscopy;
microscope;
source;
gas puff ... See more keywords
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Published in 2025 at "Optics express"
DOI: 10.1364/oe.554392
Abstract: Birefringence, an inherent optical characteristic in anisotropic materials arising from structural anisotropy of materials or mechanical stress, plays a major role in understanding the microscopic structures of anisotropic materials and has been widely studied in…
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Keywords:
shot;
birefringence;
snap shot;
based digital ... See more keywords