Development of Monochromatic Analytical Electron Microscope Equipped with Higher-Order Aberration Corrector
Sign Up to like & getrecommendations! Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619003684
Abstract: Monochromatic and aberration corrected electron microscope was developed in order to study an electronic structure of various materials, combining with a scanning transmission electron microscope (STEM) and an electron energy-loss spectroscopy (EELS) at atomic scale.… read more here.
Keywords: microscope equipped; aberration; order; microscope ... See more keywords