MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope
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DOI: 10.3390/mi8020031
Abstract: In this work, we designed a micro-electromechanical systems (MEMS) device that allows simultaneous direct measurement of mechanical properties during deformation under external stress and characterization of the evolution of nanomaterial microstructure within a transmission electron… read more here.
Keywords: quantitative situ; microscope mems; mems device; electron microscope ... See more keywords