Microscopic charge fluctuations cause minimal contrast loss in cryoEM
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DOI: 10.1016/j.ultramic.2018.01.011
Abstract: Highlights • A physical account of charge fluctuations in low-dose cryoEM is presented.• We quantify the bee swarm charging phenomenon on cryoEM specimen.• We measure the envelope function caused by charge fluctuations.• The effects of… read more here.
Keywords: cryoem; cause minimal; fluctuations cause; charge fluctuations ... See more keywords