Microscopic Distributions of Defect Luminescence From Subgrain Boundaries in Multicrystalline Silicon Wafers
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DOI: 10.1109/jphotov.2017.2684904
Abstract: We investigate the microscopic distributions of sub-band-gap luminescence emission (the so-called D-lines D1/D2/D3/D4) and the band-to-band luminescence intensity, near recombination-active subgrain boundaries in multicrystalline silicon wafers for solar cells. We find that the sub-band-gap luminescence… read more here.
Keywords: band; subgrain boundaries; luminescence; microscopic distributions ... See more keywords