Electrostatic Force Microscopy: Measuring Ion Mobility, Non-linear Optical Signals and Achieving Ultimate Time Resolution
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DOI: 10.1017/s1431927620023429
Abstract: The ground and excited electronic level structure of quantum systems is of fundamental importance for their optical, electronic and chemical properties. Single-electron sensitive electrostatic force measurement with AFM has been demonstrated to be capable of… read more here.
Keywords: time; microscopy; electrostatic force; microscopy measuring ... See more keywords