Scanning electrochemical microscopy at the nanometer level.
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DOI: 10.1039/c7cc09777h
Abstract: This review describes how one can perform nanometer (nm)-scale SECM experiments through advances in tip fabrication and positioning and instrumentation design. Basic SECM methodology including instrumentation and feedback and generation/collection modes are discussed. Aspects of… read more here.
Keywords: nanometer; microscopy; scanning electrochemical; level ... See more keywords