Scanning electron microscopy with polarization analysis for multilayered chiral spin textures
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DOI: 10.1063/1.4998535
Abstract: We show that scanning electron microscopy with polarization analysis (SEMPA) that is sensitive to both in-plane magnetization components can be used to image the out-of-plane magnetized multi-domain state in multilayered chiral spin textures. By depositing… read more here.
Keywords: microscopy polarization; microscopy; multilayered chiral; electron microscopy ... See more keywords