Atomic-Force Microscopy Probe-Activated Morphological Transformations in a Nanophase Copper Wetting Layer on Silicon
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DOI: 10.1134/s1063785018030094
Abstract: The phase transition of the nanophase Cu2Si wetting layer on a Si(001) substrate to more stable Cu silicide has been selectively activated by atomic-force microscopy in air. The transition is accompanied by an increase in… read more here.
Keywords: microscopy; force microscopy; microscopy probe; atomic force ... See more keywords