Electrostatic Force Microscopy: A Promising Diagnostic Tool to Measure Interphase Properties
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DOI: 10.1142/s0219581x19400386
Abstract: There is currently no reliable method for studying interfacial regions within dielectric nanocomposites. The aim of this work was to develop experimental protocols and signal analysis involving Electrostatic Force Microscopy (EFM). Model samples made of… read more here.
Keywords: microscopy; electrostatic force; interphase; microscopy promising ... See more keywords