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Published in 2023 at "Micromachines"
DOI: 10.3390/mi14030526
Abstract: The Mo/Si multilayer mirror has been widely used in EUV astronomy, lithography, microscopy and other fields because of its high reflectivity at the wavelength around 13.5 nm. During the fabrication of Mo/Si multilayers on large,…
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Keywords:
microstructure multilayers;
mask;
multilayers deposited;
shadow mask ... See more keywords