Characterization and Analysis of On-Chip Microwave Passive Components at Cryogenic Temperatures
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DOI: 10.1109/jeds.2020.2986722
Abstract: This paper presents the characterization and modeling of microwave passive components in TSMC 40-nm bulk CMOS, including metal-oxide-metal (MoM) capacitors, transformers, and resonators, at deep cryogenic temperatures (4.2 K). To extract the parameters of the… read more here.
Keywords: cryogenic temperatures; analysis chip; characterization analysis; passive components ... See more keywords