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Published in 2017 at "Journal of Electronic Materials"
DOI: 10.1007/s11664-017-5636-0
Abstract: We used a microwave dielectric resonator to study how the process of thermal oxidation of high resistivity silicon wafers reduces the wafer microwave resistivity. Measurements were performed before surface thermal oxidation, after the oxidation, and…
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Keywords:
resistivity;
microwave resistivity;
high resistivity;
resistivity silicon ... See more keywords