Study of interface reaction in a B4C/Cr mirror at elevated temperature using soft X-ray reflectivity
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DOI: 10.1107/s1600577522004738
Abstract: Non-destructive interface characterization of boron carbide shows a significant change at 550°C in the interface region formed between an adhesive chromium layer and native oxide layer on silicon substrate, whereas the principal layer of boron… read more here.
Keywords: study interface; b4c mirror; mirror elevated; interface ... See more keywords