Recent Advances in Mitigation of Whiskers from Electroplated Tin
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DOI: 10.1007/s11837-019-03933-7
Abstract: Tin whiskers pose an electrical reliability risk in the form of potential short circuits. This problem was solved in the past by adding a few percent of Pb during Sn electroplating, but with the ban… read more here.
Keywords: mitigation whiskers; advances mitigation; whiskers electroplated; mitigation ... See more keywords