Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology
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DOI: 10.1109/access.2020.3008225
Abstract: Multiple-node upsets (MNUs) caused by charge sharing effects are dramatically increasing in advanced nanoscale digital latches. Consequently, the robust latches against MNU cases are increasingly important. Although some existing robust latches are designed to recover… read more here.
Keywords: node upset; latch; multiple node; mnu cases ... See more keywords