Multi-Mode Elastic Peak Electron Microscopy (MM-EPEM): A new imaging technique with an ultimate in-depth resolution for surface analysis.
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DOI: 10.1016/j.ultramic.2018.02.008
Abstract: A non-destructive new imaging technique called Multi-Mode Elastic Peak Electron Microscopy (MM-EPEM), hypersensitive to surface chemistry and with an in-depth resolution of one atomic monolayer was developed. This method consists on performing several MM-EPEM images… read more here.
Keywords: microscopy; mode elastic; multi mode; new imaging ... See more keywords