Corrigendum to 'Modeling the degradation mechanisms of C6/LiFePO4 batteries'
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Power Sources"
DOI: 10.1016/j.jpowsour.2018.02.042
Abstract: The authors regret that the following errors were present within their article: 1. In equation 10 and 11, the rate constant “k” should be in lowercase; the same problem existed within table 2 and 3… read more here.
Keywords: mechanisms lifepo4; modeling degradation; corrigendum modeling; lifepo4 batteries ... See more keywords
Modeling the degradation/recovery of short-circuit current density in perovskite and thin film photovoltaics
Sign Up to like & getrecommendations! Published in 2017 at "Organic Electronics"
DOI: 10.1016/j.orgel.2017.01.034
Abstract: Abstract A time-dependent approach has been developed for modeling the degradation and recovery rate of short-circuit current density in thin film and perovskite solar cells. A set of six different equations has been derived by… read more here.
Keywords: degradation; modeling degradation; current density; density ... See more keywords
Modeling of degradation in normal and inverted OSC devices
Sign Up to like & getrecommendations! Published in 2019 at "Solar Energy Materials and Solar Cells"
DOI: 10.1016/j.solmat.2018.11.039
Abstract: Abstract Degradation of organic solar cells (OSC) remains a problem which has prevented its commercial exploitation. While there are several experimental studies pointing towards different reasons behind the atmospheric degradation of these devices, yet a… read more here.
Keywords: degradation normal; osc devices; inverted devices; modeling degradation ... See more keywords
Modeling of the degradation of CMOS inverters under pulsed stress conditions from ‘on-the-fly’ measurements
Sign Up to like & getrecommendations! Published in 2021 at "Solid-state Electronics"
DOI: 10.1016/j.sse.2021.108094
Abstract: Abstract In this work, an ‘on-the-fly’ measurement technique for the monitoring of CMOS inverters performance degradation is presented. This technique allows the characterization of the circuit degradation simultaneously with the applications of the stress. In… read more here.
Keywords: voltage; modeling degradation; inverters pulsed; degradation cmos ... See more keywords
Analytical and Numerical Modeling of Degradation and Pyrolysis of Polyethylene: Measuring Aging with Thermogravimetry
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DOI: 10.3390/polym14132709
Abstract: Aging reactions due to heat and radiation cause chain scissions and cross-linking in cross-linked polyethylene (XLPE). We have developed theoretical and numerical graph models to study the evolution of the gel fraction and network properties… read more here.
Keywords: numerical modeling; analytical numerical; modeling degradation; degradation ... See more keywords