High-speed processing of X-ray wavefront marking data with the Unified Modulated Pattern Analysis (UMPA) model.
Sign Up to like & getrecommendations! Published in 2022 at "Optics express"
DOI: 10.1364/oe.474794
Abstract: Wavefront-marking X-ray imaging techniques use e.g., sandpaper or a grating to generate intensity fluctuations, and analyze their distortion by the sample in order to retrieve attenuation, phase-contrast, and dark-field information. Phase contrast yields an improved… read more here.
Keywords: analysis umpa; wavefront marking; modulated pattern; pattern analysis ... See more keywords
Modulated pattern scanning microscopy.
Sign Up to like & getrecommendations! Published in 2022 at "Optics letters"
DOI: 10.1364/ol.451958
Abstract: In confocal microscopy, the effective optical transfer function (OTFeff) with Gaussian plane wave illumination covers very few high-frequency components, which prohibits further improvement of the resolution. We propose modulated pattern scanning microscopy (MPSM) to achieve… read more here.
Keywords: microscopy; scanning microscopy; pattern scanning; modulated pattern ... See more keywords