Articles with "moir patterns" as a keyword



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Observation of Moiré Patterns in Twisted Stacks of Bilayer Perovskite Oxide Nanomembranes with Various Lattice Symmetries.

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Published in 2022 at "ACS applied materials & interfaces"

DOI: 10.1021/acsami.2c14746

Abstract: The design and fabrication of novel quantum devices in which exotic phenomena arise from moiré physics have sparked a new race of conceptualization and creation of artificial lattice structures. This interest is further extended to… read more here.

Keywords: twisted stacks; stacks bilayer; observation moir; moir patterns ... See more keywords
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Vortex dynamics, pinning, and angle-dependent motion on moiré patterns

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Published in 2021 at "Physical Review B"

DOI: 10.1103/physrevb.104.024504

Abstract: We examine pinning and dynamics of Abrikosov vortices interacting with pinning centers placed in a moiré pattern for varied moiré lattice angles. We find a series of magic angles at which the critical current shows… read more here.

Keywords: vortex dynamics; dynamics pinning; moir patterns; angle dependent ... See more keywords
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Ultraflatbands and Shear Solitons in Moiré Patterns of Twisted Bilayer Transition Metal Dichalcogenides.

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Published in 2018 at "Physical review letters"

DOI: 10.1103/physrevlett.121.266401

Abstract: Ultraflatbands in twisted bilayers of two-dimensional materials have the potential to host strong correlations, including the Mott-insulating phase at half-filling of the band. Using first-principles density functional theory calculations, we show the emergence of ultraflatbands… read more here.

Keywords: transition metal; shear solitons; twisted bilayer; moir patterns ... See more keywords
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Combination of Convolutional and Generative Adversarial Networks for Defect Image Demoiréing of Thin-Film Transistor Liquid-Crystal Display Image

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Published in 2020 at "IEEE Transactions on Semiconductor Manufacturing"

DOI: 10.1109/tsm.2020.3005164

Abstract: In thin-film transistor liquid crystal display (TFT-LCD) manufacturing, the automatic recognition and classification of defects can help manufacturers monitor abnormalities, identify potential process problems, and swiftly respond to these process problems. Thus, yield loss can… read more here.

Keywords: image; thin film; moir patterns; film transistor ... See more keywords
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Ronchi and Moiré patterns for testing spherical and aspherical surfaces using deflectometry.

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Published in 2018 at "Applied optics"

DOI: 10.1364/ao.57.009963

Abstract: The aim of this paper is to compare the Ronchi test and the Moiré deflectometry applied to a new pattern. To do so, we used two Ronchi patterns (typical Ronchigrams) produced by two identical Ronchi… read more here.

Keywords: deflectometry; testing spherical; ronchi moir; patterns testing ... See more keywords