Structure‐Dependent Influence of Moisture on Resistive Switching Behavior of ZnO Thin Films
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DOI: 10.1002/admi.202100915
Abstract: Resistive switching mechanisms underlying memristive devices are widely investigated, and the importance as well as influence of ambient conditions on the electrical performances of memristive cells are already recognized. However, detailed understanding of the ambient… read more here.
Keywords: moisture; thin films; zno thin; resistive switching ... See more keywords