In situ synchrotron X-ray diffraction study of the electrochemical reduction of SiO2 in molten CaCl2
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DOI: 10.1016/j.elecom.2020.106740
Abstract: Abstract In situ synchrotron X-ray diffraction was used to investigate the electrochemical reduction of SiO2 to Si in molten CaCl2 at 1123 K for the first time. The present technique enabled direct determination of intermediate products… read more here.
Keywords: ray diffraction; synchrotron ray; molten cacl2; diffraction ... See more keywords