Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
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DOI: 10.1107/s1600577519001802
Abstract: A fluorescence intensity monitor has been developed for the non-invasive, pulse-by-pulse normalization of LCLS-II experiments. The linearity, noise and position sensitivity of the detectors have been characterized. read more here.
Keywords: intensity monitors; intensity; intensity beam; position ... See more keywords